Past meetings topics included the following: ( If you want more information on these, please contact the appropriate speaker. )

November 15, 2006
A Discussion on Double Negative Materials, Transition Boundary Conditions, Controllable Surfaces, and Design of a New Class of Metamaterials was presented by Christopher Holloway, National Institute of Standards and Technology (NIST) Electromagnetics, Division U.S. Department of Commerce, Boulder Laboratories. Chris discussed metamaterials theory and applications. He also showed that the effective permeability and permittivity of composite medium consisting of insulating magneto-dielectric spherical particles embedded in a background can be simultaneously negative for wavelengths where the spherical inclusions are resonant to form a DNG material. The theoretical results presented showed that composite media having much simpler structure than those recently reported in the literature can exhibit negative permeability and permittivity over significant bandwidths.  Click here for Chris' presentation  Additional information can also be found here.. http://www.interferencetechnology.com/emcnews/id1145 

March 21, 2006
Semiconductor Modeling for High-Speed Digital  Circuits: Roy Leventhal described (from his new book) the following:
A large percentage of simulation models used for high-speed digital networks are SPICE transistor level physical models. However, SPICE models can be a computation burden. IBIS models are also used for component level simulation and offer the advantage of speed and simplicity, but they are not meeting current needs for modeling complex I/O buffers. To expand the capabilities of the IBIS models, experts in the field of computational electromagnetics are r elying on macromodeling, AMS modeling and additions aimed at Power Integrity analysis. IBIS models are being structured with more analysis capacity so that I/Os with adaptable, adjustable drive levels and other refinements can be simulated without including excessive detail.   The paper will present a step-by-step review of how various levels of simplification (abstraction) are applied to transistor level physical models resulting in behavioral models, macromodels, and equation-based models.  Participants will see how to achieve the best speed versus accuracy trade-off of simplicity versus detail that is balanced to their needs. The session concludes with a brief introduction to Cadence Design Systems, Inc., macromodeling templates. Roy Leventhal is an independent trainer and contractor with 45 years of engineering experience specializing in EDA modeling and simulation for signal integrity, power integrity, and EMI. Roy has a background in RF circuit design, IBIS, SPICE and Scattering-Parameter semiconductor modeling, device physics, component reliability, and failure analysis. He earned his BSEE/MSEE at Illinois Institute of Technology. More recently, Roy took additional post-graduate courses at the University of Wisconsin – Milwaukee, concentrating on RF and microwave subjects.

February 15, 2006
Mr. Hofmann presented information on ANSI C63.5 which is the standard for determination of free-space antenna factors and the calibration methods for antennas used in EMC testing. His presentation covered the various calibration methods, i.e. Standard Site Method, Reference Antenna Method, and Equivalent Capacitance Substitution Method. He also provided information on the most the recent document revision and the significance of the updates to EMC testing.  Bob Hofmann is a member of several ANSI C63 subcommittees and led the 1987 and 1999 revisions of ANSI/IEEE C63.12 on Electromagnetic Compatibility Limits. He worked on the 1991, 1992, 2001, and 2003 revisions of C63 .4 on Methods of Measurement of Emissions. Bob is a past President and a Life Member of the IEEE EMC Society and a Senior Member of the IEEE. Bob retired from Bell Laboratories/Lucent Technologies after 44 years of service. He represented Bell Labs as chairman of the Information Technologies Industries Council (ITI) TC-5 EMC Committee from 1990 to 1999. He is a NARTE registered engineer.  He has a BSEE degree from the University of Florida and an MSEE degree from New York University.

October 15, 2005
Gary Fenical, Laird Technologies presented the Advancements in RF Shielding Materials. Gary discussed the higher mechanical reliability requirements, as well as cost cutting pressures that are driving electronics packaging engineers to find new and innovative EMC shielding solutions. This presentation covered key advancements in shielding technology available today and related developments on the horizon.   Just about every class of shielding product has seen noteworthy changes. Foam-based products, such as Ultra-Soft Sculpted Fabric-Over-Foam offer a high degree of compression set performance with increased shielding over the life of the gasket.  Conductive foams have been developed for low compression load deflection (CLD), lower closure force, while delivering X, Y, and Z axis conductivity for improved high-frequency shielding.  This makes conductive foam an ideal EMI shielding material in vertical compression and low cross-shear applications .   Conventional shielding and RF gasketing materials no longer meet the performance requirements of today’s electronics. Miniaturization and ever increasing frequencies have contributed to the need for change. Electrically conductive elastomers which can be produced in extremely small profiles can be deposited onto small substrates; they are fast becoming the answer to the miniaturization dilemma.  The need to reduce costs but not performance, while at the same time increasing geometric complexity, has led to the development of much more versatile and higher performance EMI products.  Metal-Mold in Place (MIP) and Rotary Form in Place (FIP) provide small intricate gaskets, unique geometries, minimal footprint, and excellent shielding.  Frameless vent panels greatly improve cooling capability with no reduction in shielding while providing a more robust cost effective solution.

March 15, 2005
This presentation was on the latest update to the European EMC Directive. A comprehensive look at the recent changes to the directive, the date for implementation, how it will effect test methodology, test reporting, testing procedures, and testing laboratories, as well as the requirements for existing products already on the market.
The presenter was Donald L. Sweeney, Senior EMC Engineer and President and founder of D.L.S. Electronic Systems, Inc, an independent compliance testing and consulting company. He is a graduate of the Department of Electrical Engineering, University of Illinois at Champaign Urbana, and has over 40 years experience in the EMC and electrical engineering fields. Mr. Sweeney specializes in EMC, RFI, and EMI consulting and testing. He has taught EMC at the University of Wisconsin, and at Oakton College. Mr. Sweeney has served as a special consultant to Lawrence Livermore National Laboratory, and the Nuclear Regulatory Commission. Mr. Sweeney is a member of IEEE EMC Society, currently on the IEEE EMC Society Board of Directors, and is past Chapter Chairman for the Chicago chapter of the IEEE EMC Society. Mr. Sweeney is the founding chairman of the U. S. Council of Independent Laboratories.  For additional details, please contact the speaker, Donald L. Sweeney of DLS at 847-537-6400.

February 15, 2005
The Presentation "EMC Testing of Substation Products" concerns the EMC testing requirements for products that are installed in Generation or Substation plants here in the US or in Europe. The Generic EMC Standards for Substations (CIGRE 36.04, NEMA ICS-1 and IEC 61000-6-5) are discussed and their similarities are pointed out in detail. A fuller view of the testing requirements for Protective Relaying equipment is presented, and a run-down of the required tests is given. The future growth potential of utility products is very bright and these tests will be run more often than in the past. Many manufacturers will need to become acquainted with these Standards to access this growing market. Their products will be evaluated using these types of tests and the reliability of the finished Utility installation will be affected by how well their products perform on these tests. Anyone that needs to install control products into Substation settings will be tasked with accrediting products to these Standards eventually.  Additional questions, please contact Jerry Ramie, ARC Technical Resources.

November 15, 2004
Emissions Measurements Using Grid Array of Near Field Probes..
Emscan technology applies a grid array of small H-field probes embedded in
an 8 layer circuit board covered by a protective surface upon which the PCB
to be tested is placed. The array of antennae and electronic switching
achieve high-speed measurement of the current flows on populated printed
circuit boards.  The user can visualize real time emission hot spots in either a spectral or
spatial format and utilize the information to identify problem areas and
possible solutions. This presentation will include a demonstration of the
technology.  Speaker:   Doug McKinnon, EMSCAN Corporation http://emscan.com/

April 10, 2004
Update on Ferrite Technology 
This presentation reviewed and discussed the most recent advances in Ferrite component technology. Areas addressed included ferrite component use and installation techniques, as well as effects of temperature on permeability and frequency response. Also reviewed were advances in materials technology as changes in manufacturing methodology and material morphology provide enhanced product performance.  The presenter was John Horner of the Fair-Rite Corporation. John is a member in good standing with the IEEE EMC Society, and is a past presenter at the IEEE International Symposium on Electromagnetic Compatibility as well as a presenter at the IEEE EMC Society Chicago Chapter Mini Symposium on EMC. John currently holds the position of Sales Manager of Fair-Rite Products and has over 21 years experience in the field of EMC

March 10, 2004
Calibration of RF Field Probes from 10kHz-40GHz  
RF field probes play a vital role in EMC test laboratories where RF immunity testing and measurements of electric field strength are performed. This meeting will feature a discussion on methods for calibrating, use, and performance of RF Field probes. The presenter did an overview of the IEEE 1309 specification and provided a description of the various types of probes including: single & multi-axis monopoles, orthogonal dipoles, single dipole antenna probes, and laser/crystal elements. The various calibration methods will be reviewed, such as TEM Cell, strip line, Tri-plate, GTEM, discrete antennas, open-ended waveguides, standard gain horn antennas, mode-stirred chambers, and OATS vs. anechoic site.  The presenter also described probe calibration parameters such as frequency response, linearity, channel match, and isotropic response.  Finally, the discussion covered parameters affecting calibrations, probe usage in the lab, and finally measurement uncertainty.   Jack Andrews has worked for many years as an EMC engineer and is currently employed by Liberty Labs.  

February 12, 2004
An Approach to Board Level Suppression
This talk covered the setup and operation of a low cost suppression site.  It showed an approach to setting up and using a site for identifying and suppressing EMI signals from small electronic devices or systems.  These emissions can be identified by means of a systematic, organized approach down to the device and pin level where suppression techniques can then be applied.
Roger Swanberg is a NARTE Certified and EMC Engineer Senior EMC Engineer  working at D.L.S. Electronic Systems, Inc.  He is a Graduate of the Illinois Institute of Technology in Chicago and has held various positions in the Electronic Engineering field for over 40 years. As EMC and Electronics Design Engineer, Roger worked for Motorola Consumer Products and Zenith Radio in Color TV design, Nuvatec Design Consulting as EMC designer and Manager of EMI Testing Services, US Robotics as Regulatory Compliance and Engineering Support Manager, Motorola Lighting and Motorola Cellular as EMC and Electronics Designer.   He is presently Vice-Chair for the IEEE EMC Society and Secretary for the IEEE 2005 Symposium in Chicago. For additional information on this presentation, contact Roger at 847-537-6400.

November 19, 2003
Conducted Immunity Transient Testing for CE Marking
This seminar provided a background knowledge of the IEC and EN standards used for EMC conducted transient immunity testing for CE marking of electrical and electronic products.  The phenomena behind the transients plus verification techniques for the transient pulses was discussed.  Special emphasis was given to the requirements for EN 60601-1-2, the Medical Electrical Equipment EMC requirements and tests as related to conducted immunity.  Pending changes to the conducted immunity requirements for medical equipment are outlined so that the EMC engineer can be prepared to implement these new requirements in a timely manner. Thomas C. Moyer graduated from Drexel University in Philadelphia with a BSEE degree.  He has worked for Ford Motor Company designing automotive electronics systems and for Ametek U. S. Gauge designing aircraft engine instruments.  More recently, he has been a sales engineer and regional sales manager.  He joined Amplifier Research in 1996 as a product line
marketing specialist.  For additional information, Tom can be reached at 215-723-8181.

October 14, 2003

This event was a joint meeting of the Chicago Chapters of the IEEE EMC Society, Society of Automotive Engineers (SAE), and the Institute of Environmental Science and Technology (IEST). 
Norman Traub , Director of Electrical Initiatives , SAE International discussed 42 Volt DC Systems.  This presentation outlined efforts by the automotive community to provide a degree of standardization to the process and defined some of the technical challenges facing implementation in production vehicles including the impact of 42V on electrical arcing of contacts.   Norman L. Traub is the SAE Director of Electrical Initiatives, including the 42V Initiative. Traub has lectured extensively on 42V electrical systems, including the SAE World Congress, International Power Electronics Conference, International Society of Automotive Transportation and Technology. He is a member of the MIT/Industry Consortium on Advanced Automotive Electrical/Electronic Components and Systems (50 multi-national companies). He is also the chairman of the SAE 42V Advisory Committee. Traub received his MSEE from Michigan State University.

February 11, 2003

Mike Windler, Underwriters Laboratories discussed the summary of recent efforts conducted under the auspices of the American National Standards Institute (ANSI) Accredited Standards Committee C63, Sub-Committee 1, working group 1-13.2. The main purpose of this group is to assess the applicability of low-frequency site qualification methodologies, prescribed in current domestic and international standards (e.g. CISPR, ANSI) to frequencies above 1 GHz. A new measurement procedure, which uses presently available equipment and should fully evaluate all types of facilities, has been derived. Conceptually, this procedure is a rotational pattern comparison of an antenna in a reference site to the same antenna in a test site .  Michael J. Windler is an Associate Manager responsible for the operation of the EMC laboratory of Underwriters Laboratories Inc. in Northbrook IL where he has worked since 1985.  Any questions, call Mike at 847-664-3409

December 11, 2002

Our "First Holiday" Party was held at "Dave & Busters".  Attended by over 50 people, this seems like it will continue in the future!  Several people went home with gift certificates certainly welcomed at this time of year.  See you next year!

November 20, 2002

Mike Howard of Liberty Labs discussed the calibration of a dipole antenna used on an upcoming satellite mission to the planet Mars, called Mars Express.  The dipole was placed on this satellite and operates from 1.5 to 5.5Mhz. The dipole is pulsed and will be used to detect water beneath the perma frost of the surface of Mars.  The Mars Express will be launched atop a Russian Soyuz rocket next June.   

October 15, 2002

PCB for EMC was presented by one of our own, Roger Swanberg, of DLS.  Roger talked about the fundamentals of designing for EMC when doing printed wiring cards.  In addition, how to do the design right the first time.  For details on this presentation, please call Roger at DLS, at 847-537-6400.  

September 18, 2002

This was the kickoff meeting for the chapter!  Chapter President Ray Klouda  had various different speakers discussing the IEEE EMC International Symposium in Minneapolis, and trends that are in the industry.  In addition, plaques were delivered to Jack Black (2001) and Frank Krozel (2000) for  "Person of the Year! (Congrats Jack) and Frank Krozel.  Tom Braxton discussed 2005 at Navy Pier, and that is moving along very well!  Roy Leventhal discussed EMI Simulation Sources and went into great detail on resources available to all.  The meeting closed with a great CD of Don White discussing war stories of EMC as related to the Society in Washington DC.  Jack Black ended the meeting with his own war stories of Montreal.  This venue seemed to appeal to all there. 

April 17, 2002

Jim Muccioli, a NARTE certified EMC and ESD engineer from Jastech EMC Consulting , X2Y, discussed broadband capacitor performance through Inductance Cancellation... The presentation included an overview of X2Y capacitor technology which utilizes unique internal layered circuit architecture.  The device is applied for RF shielding, decoupling, noise suppression, transient voltage suppressions and is designed to reduce the number of standard capacitors, inductors, ferrites, and other passive elements used in a circuit.

March 26, 2002

Dwayne Davis, Associated Research, Inc.,Technical Services Manager, discussed applications and analysis covered by EN 50191.  In addition he covered what methods can be employed to meet this new standard. EN 50191 covers virtually every aspect of setting up a safe work station.   He is a recognized expert in the field of electrical safety testing and its application.

February 20, 2002
Jerry Meyerhoff, (847-480-5886) Principal Staff Engineer, Motorola Automotive,  explained the application of computer modeling, simulation, and EMC analysis techniques to better understand the EMC behavior of electronic systems. He presented his experiences in EMC troubleshooting and demonstrated the useful and practical application of computer modeling and simulation techniques. The discussion drew from examples of automotive electronics, however the techniques have wide applicability to electronics in all industries.

December  12, 2001
Dave Hurd, LeCroy Corp (630-258-2301), covered the measurements of interest for designers of switchmode power conversion circuits and devices. With the goal of high efficient and reliable designs, he presented the acquisition of voltage and current, their relationship in switchmode power conversion circuits, and the analysis of power devices to perform accurate analysis while the power transistor or diode is operating in the non-ground referenced primary circuit of an off-line switchmode power supply. Instrumentation requirements such as overdrive recovery, high frequency common mode rejection, and channel-to-channel time delay matching were covered. A unique technique was covered for using information contained in the pulse width modulation signal to find a power circuit’s step response and soft start performance.   

October  17, 2001
Kurt B. Fischer, Hyper Corporation discussed the Bluetooth Wireless Technology including what is Bluetooth Wireless Technology, how to qualify a Bluetooth component, radio module, or end product (process overview), how to test to the RF test specification,  what is the Bluetooth qualification test facility application and approval process, validation of test instruments and test systems  --- why is validation important?  Kurt included a complete process that the Bluetooth manuacturers need to go through to get the product to market.  Copies of Kurt's presentation are available my e-mailing Frank Krozel.

  
January 17, 2001 
H. R.(Bob) Hofmann, (630-979-6237) Distinguished Member of Technical Staff, Bell Laboratories,  Naperville, discussed the introduction on the topic of measurement uncertainty in radiated and conducted emission measurements.  It used simple mathematics to show how the various components used in making measurements add to the total measurement uncertainty of the final results.   Bob Hofmann has been with Bell Labs for 43 years, working on EMC issues for the past 22 years.  He is the head of the Lucent/Bell Labs Corporate EMC Committee.  He represents Lucent on ANSI accredited EMC Committee C63 and various C63 subcommittees, and is the Lucent representative to and vice-chair of ECMA EMC committee TC-20.  He was the lead editor of ANSI C63.12-1999 and contributing editor to ANSI C63.4-1991, 1992, and 2000.

December 13, 2000
Joe Weibler, ETS-Lindgren, ( 630-307-7200) Engineering Manager, presented an introduction to reverberation chamber technology, introduced the concepts, concerns and proper use of chambers to those new to the technology.  An outline of the current status of standards and recent developmental efforts for reverberation chamber technology also was presented to bring users, and potential users, up to date.  A demonstration of reverberation chamber technology was presented in the on-site chamber at the Lindgren facility." 

November 16, 2000
Jerry Meyerhoff, Motorola Automotive, (847-480-5686), Principal Staff Engineer, discussed "Unexpected resonance effects in vehicle applications.'   A case study for radiated RF immunity of electronics installed in an over-the-road truck.  Measured whole vehicle anechoic chamber lab data was compared to wireframe models simulated with NEC, the Numeric Electromagnetic Code .

October 25, 2000
Dr. Clifford Kraft, Lucent Technologies, (630-979-3280) discussed the effects of a small metal reflector as the reflector moved about the Fresnel ellipse of an Open Area Test Site.
The effect and the modeling technique used to determine it was presented.

September 20, 2000
Mr. Tom Moyer, Electrical Sales Engineer (215-723-8181), Amplifier Research  Product manager for EM Test, Inc.  This presentation reviewed a common and reproducible basis for evaluating the performance of electrical and electronic products when subjected to repetitive Electrical Fast Transients or classically known as ... EFT.

April 26, 2000
Mark Montrose, Principal Consultant of Montrose Compliance Services, Inc., Senior member IEEE,  current member of the Board of Directors for the IEEE EMC Society, and Distinguished Lecturer for the society.
This presentation illustrated, in simple form, how and why EMI gets developed within a printed circuit board (PCB) and the manner in which propagation occurs; radiated and conducted.  Basic concepts are examined to remove the mystery on why problems are designed into the product, and how one can prevent making mistakes from happening time and time again.  

March 29, 2000
The Medical Directive - An Update...was presented by Pat Malloy (215-723-8181), Senior Sales Applications Engineer, Amplifier Research.   This presentation dealt with Medical Device Directive 93/42/EEC with an emphasis on EMC compliance. Both the current version as well as the proposed 2^nd edition were covered.  Amplifier Research manufactures power amplifiers from D.C. to 40GHz, EMC Immunity antennas, ARCell, and a variety of accessories. In addition, Amplifier Research has a strategic alignment with EM Test, for Conducted Immunity test equipment.

February 23, 2000
Donald L. Sweeney, President, D.L.S. Electronic Systems, Inc (847-537-6400). presented  how a manufacturer can use a CAB to gain access to the European market.  The steps that are needed to comply with the rules.  It will also include the latest news from some of the committees and what is on the horizon as far as the European Union is concerned.  This was a pizza meeting and all enjoyed the camaraderie, compliments of DLS.

January 26, 2000
Kevin Baldwin, EMC Test Systems (203-838-4555) presented the Cassper "Virtual Chamber", and source localization system.  This is a very hot topic for people in need of "minimizing" ambient signals.  The actual system will be demonstrated on February 29, 2000 at the Holiday Inn in Itasca.  ETS, under the umbrella of ESCO, offers the EMC community RF Shielded Enclosures, Rantec Anechoic Material and chambers, and EMCO EMC products. 

December 8, 1999
Roy Leventhal works at 3Com (847-797-2152) in Mt. Prospect as a Sr. Signal Integrity Engineer. He earned his BSEE & MSEE at Illinois Institute of Technology, the latter in 1966. More recently he was in the PhD EE program at the University of Wisconsin - Milwaukee before that was interrupted by career moves. His main area of study was RF and microwave.  Roy had in interesting discussion on Signal Integrity.
3Com  manufacturers the famous Palmtop hand helds, modems for laptop and desktop computers, camera systems for internet operation.

October 27, 1999
Bob Hofmann of Lucent (630-979-3627) discussed the round robin of tests on a radiator that will be shipped around the country, and the results tabulated and compared.  This should provide the EMC community with some interesting information on OATS, Chambers and receiver performance reference repeatability.  FYI, Bob's results were resolved down to the hundredth of a DBuV!  In addition, Bob updated us on the FCC's intent  of dropping Part 15 and adopting CISPR 22 for Conducted Emissions.

September 29, 1999
Dr. Clifford Kraft of Lucent (630-979-3280) discussed RF coupling into cables, and the different methodologies that need to be addressed when attempting to resolve the interference.  Many different guidelines were discussed, like if impedance is low, use inductors - if the impedance is high, use capacitors.